Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.11889/1265
Title: Reducing test power for embedded memories
Authors: Awad, Ahmed
Keywords: Embedded computer systems - Testing;Semiconductor storage devices - Testing;Electric power consumption
Issue Date: 2011
Publisher: Birzeit University
URI: http://hdl.handle.net/20.500.11889/1265
Appears in Collections:Theses

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