Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.11889/1265| Title: | Reducing test power for embedded memories | Authors: | Awad, Ahmed | Keywords: | Embedded computer systems - Testing;Semiconductor storage devices - Testing;Electric power consumption | Issue Date: | 2011 | Publisher: | Birzeit University | URI: | http://hdl.handle.net/20.500.11889/1265 |
| Appears in Collections: | Theses |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| thesis_109.pdf | 1.5 MB | Adobe PDF | View/Open |
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