Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.11889/3264
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Abdul-Baqi, Adnan | - |
dc.contributor.author | Schreurs, Piet | - |
dc.contributor.author | Geers, Marc | - |
dc.date.accessioned | 2016-10-29T08:01:59Z | - |
dc.date.available | 2016-10-29T08:01:59Z | - |
dc.date.issued | 2005 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11889/3264 | - |
dc.description | Physics Schreurs,Piet: Geers,Marc: | en_US |
dc.language.iso | en | en_US |
dc.title | Fatigue damage modeling in solder interconnects using a cohesive zone approach | en_US |
dc.type | Contribution in refereed journals | en_US |
newfileds.item-access-type | open_access | en_US |
newfileds.general-subject | Physics | en_US |
item.languageiso639-1 | other | - |
item.fulltext | With Fulltext | - |
item.grantfulltext | open | - |
Appears in Collections: | Fulltext Publications |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Fatigue damage modeling in solder interconnects using a cohesive zone approach.pdf | 716.32 kB | Adobe PDF | View/Open |
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